x-rayphotoelectron Spectrometer escalab 250 xi, thermo scientific

Technical Specification

Make

Thermo Scientific

Model

ESCALAB 250xi BASE SYSTEM WITH UPS AND XPS IMAGE MAPPING.

Sources

XR6 Micro-focused Monochromator (Al Kα XPS)

XR4 Twin Anode Mg/Al (300/400W) X-Ray Source.

EX06 Ion gun

Detector:

Two types of detectors ensure optimum detection for each type of analysis - two dimensional detector for imaging and a detector based on channel electron multipliers for spectroscopy when high count rates are to be detected

Salient Features

  Twin anode non-monochromated XPS

  Large area XPS(LAXPS)

  Small area XPS (SAXPS)

  Fast Parallel Imaging (XPI)

  Energy Resolution

  Insulator analysis

  Depth profiling capability

  Angle resolved XPS

  Ion scattering spectroscopy(ISS)

  UV Photoelectron Spectroscopy(UPS)

  E-Beam Evaporator

  REELS Facility

 

Applications

- ESCA is unique and non destructive tool to study the surfaces of the materials

- The surfaces of a corroding sample can be analysed.

- Contamination in the matrix of a catalyst can be analysed qualitatively and quantitatively

- Inter faces (SEI in Li ion battery) of energy storage devises can be analysed qualitatively and quantitatively

- Depth profiling which may give elemental composition as function of depth (1-2 µ) can be done  

Sample Requirement

 Solid samples like powder (5-10 mg), Pellet (1cm dia with 2-3mm thickness), thin film sample area (1cm2 ) may be supplied

 The sample should not contain any volatile/degassing materials which will affect Ultra High vacuum in the analysis chamber (No out -gassing allowed). The samples may be preconditioned in Vacuum oven.

 Powders may be made into pellet or form a thin coating on a clean conducting substrate like silicon, aluminium or copper foil, if necessary.

 User should clearly mention if the sample needs etching (surface cleaning). It may be noted that the etching alter the chemical composition and chemical state to some extent.

 Sample containing high vapour pressure elements such as Na, K, S, P, F, Zn, Se, As, I, Te and Hg are not suitable for depth profile analysis.

 UPS is possible only on sufficiently conducting samples.

 

 

ELECTRON SPECTROSCOPY FOR CHEMICAL
ANALYSIS (ESCA)
(OR)
X-ray PHOTOELECTRON SPECTROSCOPY (XPS)