transmission electron microscope fei tecnai 20 g2

Technical Specification

Make

FEI, The Netherlands

Model

Tecnai 20 G2

Resolution

Line-1.8 Å, & Point-2.40 Å

Magnification

TEM magnification range 25 x - 700 kx

Attachments

STEM HAADF Detector

- Resolution 0.24 nm,
- magnification 150 x – 230 Mx

EDS Detector
- Boron to higher (EDAX-make)

Sample Requirement

- Only powder samples are accepted for TEM analysis.

- Solid samples / Magnetic samples will not be accepted for TEM Analysis.

- 10mg of powder sample / 10ml of solution sample is required for TEM Analysis.

 

FEI Tecnai 20 G2