x-ray diffractometer d8 advance, bruker

Technical Specification

Make

Bruker

Model

D8 Advance

Angular Range

5° to 140°

Source

Cu Target X-ray source

Detector

LynxEye & Scintillation Counter

Power

40 KV; 30 mA

Sample Requirement

Nature of Sample

Powder & Thin films

Powder

0.5 g

Thin films

(1cm x 1cm) Area, coating thickness max 50 micron

Sample total thickness should be 1mm (substrate + coating)

Note: Uniform coating is preferred for analysis.

 

X-ray DIFFRACTOMETER (XRD) - BRUKER