x-ray diffractometer pw3040/60 x'pert pro panalytical

Technical Specification

Make

PANalytical

Model:

PW3040/60

Angular Range

5° to 140°

Source

Cu Target X-ray Source

Detector

Xcelerator

Power

40 KV; 30 mA

Resolution

0.001

Sample Requirement

Nature of Sample :

Powder & Thinfilms

Powder

0.5 g

Thin films

2 cm x 2 cm Area and coating thickness max 50 micron

Sample total thickness should be 1mm (substrate + coating)

 

X-ray DIFFRACTOMETER (XRD) - PANalytical