x-ray diffractometer smart lab guidance, rigaku

Technical Specification

Make

Rigaku

Model

Smart lab guidance

Angular Range

0.5˚ to 140˚

Source

Copper (RotatingAnode)

Power

200mA,45 kV (9kW)

Detectors

Scintillation counter (0D), D/tex(1D)

HyPix-3000 (Hybrid Pixel Array Detector(2D)

In addition to diffraction of powder and thin film following Facilities are available.

Features

Automatic sample change

Chi-phi attachment(to rotate the sample at different orientation)

Sample Requirement

1. X-ray Diffraction (0.5 - 140 degree)

Powder : 1g
Thin film : 10mm x 10mm min

2. In-situ High temperature XRD
(up to 1600)

Powder : 2g

3. In-situ Li-ion battery cell XRD

Coin Cell

4. X-ray scattering 

Liquid : 5ml

Powder : 0.5g

Note: For in-situ Electrochemical applications refer PARSTAT 4000 Specifications

 

X-ray DIFFRACTOMETER - MULTIPURPOSE XRD