Technical Specification |
|
Make |
FEI, The Netherlands |
Model |
Tecnai 20 G2 |
Resolution |
Line-1.8 Å, & Point-2.40 Å |
Magnification |
TEM magnification range 25 x - 700 kx |
Attachments |
STEM HAADF Detector - Resolution 0.24 nm, EDS Detector |
Sample Requirement |
|
- Only powder samples are accepted for TEM analysis. - Solid samples / Magnetic samples will not be accepted for TEM Analysis. - 10mg of powder sample / 10ml of solution sample is required for TEM Analysis. |