Technical Specification |
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Make |
Thermo Scientific |
Model |
MULTILAB 2000 Base system with X-Ray, Auger and ISS attachments. |
Sources |
Twin Anode Mg/Al (300/400W) X-Ray Source. EX05 Ion gun for etching and ISS studies. Electron Gun with spot size < 50mm dia. |
Detector |
110 mm radius hemispherical analyzer with 7 channeltrons. 4 variable analyzer slits viz 5, 2, 1 mm and 4mm. Operates in CAE (Constant Analyser Energy) and CRR (Constant Retard Ratio) modes. |
Salient Features |
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Sample heating and cooling stages in preparation and Analysis Chamber. Sample manipulator with high precision four axes movement. CCD camera and zoom microscope for optical viewing of the samples. |
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Applications |
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What elements and the quantity of those elements that are present within the top 1 - 12 nm of the sample surface What contamination, if any, exits on the surface or in the bulk of the sample Empirical formula of a material that is free of excessive surface contamination The chemical state identification of one or more of the elements in the sample The binding energy of one or more electronic states The thickness of one or more thin layers (1-8 nm) of different materials within the top 12 nm of the surfaces. |
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Sample Requirement |
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Solid samples like powder (5-10 mg), Pellet (1cm dia with 2-3 mm thickness), thin film sample area (1cm2 ) may be supplied The sample should not contain any volatile / degasing materials which will affect ultra high vacuum in the analysis chamber.
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