Technical Specification |
|
Make |
Horiba, Japan |
Model |
XGT-5200 X-ray analytical microscope |
Source |
X-ray tube 50 kV max, 1 mA, with Rh target |
Detector |
Peltier cooled Silicon Drift Detector (SDD) |
Elements Detected |
Na to U (with sample at normal atmospheric pressure) |
CCD camera |
Magnification 30 and 100 approx. |
Samples |
Metal plates, powders and coatings |
Energy Range |
0 - 40 keV |
Description |
|
The XGT-5200 X-ray Fluorescence micro-analyzers combine the fast, non-destructive elemental analysis of energy dispersive X-ray Fluorescence (EDXRF) with the capability to pinpoint individual particles with diameters down to 10 μm and 100 μm in size. |
|
Sample Requirement |
|
Powder |
0.5g |
Plate |
10mm x 10mm |
Liquid |
5ml |