Technical Specification

Make

Horiba, Japan

Model

XGT-5200 X-ray analytical microscope

Source

X-ray tube 50 kV max, 1 mA, with Rh target

Detector

Peltier cooled Silicon Drift Detector (SDD)

Elements Detected

Na to U (with sample at normal atmospheric pressure)

CCD camera

Magnification 30 and 100 approx.

Samples

Metal plates, powders and coatings

Energy Range

0 - 40 keV

Description

The XGT-5200 X-ray Fluorescence micro-analyzers combine the fast, non-destructive elemental analysis of energy dispersive X-ray Fluorescence (EDXRF) with the capability to pinpoint individual particles with diameters down to 10 μm and 100 μm in size.
Automated sample scanning provides detailed images of element distribution, over areas as large as 10 cm x 10 cm.

Sample Requirement

Powder

0.5g

Plate

10mm x 10mm

Liquid

5ml