Technical Specification |
|
Make |
PANalytical |
Model: |
PW3040/60 |
Angular Range |
5° to 140° |
Source |
Cu Target X-ray Source |
Detector |
Xcelerator |
Power |
40 KV; 30 mA |
Resolution |
0.001 |
Sample Requirement |
|
Nature of Sample : |
Powder & Thinfilms |
Powder |
0.5 g |
Thin films |
2 cm x 2 cm Area and coating thickness max 50 micron |
Sample total thickness should be 1mm (substrate + coating) |