Central Instrumentation Facility

Material characterization and instrumental methods of Analysis form an indispensable tool for any R and D program. The Central Instrumentation Facility (CIF) has been established at the CSIR-Central Electrochemical Research Institute, Karaikudi that acquires, maintains sophisticated analytical equipments all under one roof and provides service to the R & D projects of CSIR-CECRI, Research scholars, academic institutions and industries. The facility has grown into an important R & D-support group for spectral measurements, structure determination and materials characterization.

CIF has the following sophisticated analytical instrumentation facilities to characterize bulk materials and surfaces using Spectroscopy, Resonance, Surface analytical, X-ray, Thermal and Chromatographic techniques.


Note: Analysis of external samples have been temporarily suspended and hence, no jobcard will be entertained until further notification.


New portal for Sophisticated Analytical Instruments Facility

Analytical Facilities:

S. No. Facility Name Requisition Form
1  FT-IR Spectrometer Download (under maintenance)
2 Micro Hardness Tester Download
3 UV-VIS-NIR Double Beam Spectrophotometer Download
4 Fluorescence Spectrophotometer Download
5 Laser Raman Microscope Download
6 Tip Enhanced Raman Spectroscopy (TERS) Download
7 Scanning Probe Microscopy (SPM) Download
8 Nuclear Magnetic resonance (NMR) Download
9 Scanning Electron Microscope Download

XRD (Bruker)

11 XRD (PAN Analytical)  Download
13 Transmission Electron Microscope - TEM Download
14 Electron Paramagnetic Resonance (EPR) Spectrometer Download
15 High Resolution SEM (FESEM) Download
16 Gas Chromatography - Mass Spectrometer Download
17 High-performance liquid chromatography (HPLC)  Download
18 Gel Permeation Chromatography (GPC)
 Download (under maintenance)
19 Particle Size Analyser  Download
20 High Resolution - Transmission Electron Microscope (HR-TEM)  Download
21 CHNS Analysis  Download
22 AAS Analysis  Download
23 TGA/DSC Analysis  Download
24 TGA/DTA/DSC  Download
25 XPS/XPS [ESCA]  Download
26 XRF  Download
27 Pure Water for Lab Application
28 Surface Area Analyzer (BET)
29  LC-MS-MS Analysis


  • Analysis of samples for academic institutions and industries: These analytical facilities are being extended to other academic institutions and industries on payment basis. The technical details, charges and necessary requisition forms are available in the above table.

  • Training: On specific request CIF conducts training programmes on “Instrumental Methods of Analysis” for the benefit of R & D personnel, teaching faculties in colleges and engineers employed in industries.

  • Project guidance is offered for M.Sc and M.E / M.Tech students in their final year projects.

  • Refresher course on “Instrumental methods of analysis” for academicians and industries. Scope of the course: Chemical and physical property analysis of bulk and Surfaces, to facilitate reinforcing basic understanding of the theory and practice of analysis. Lab visit is included.

  • Certificate course: Skill development in the operation & maintenance of sophisticated Analytical instruments. This program helps to gain exposure in the operation and maintenance of analytical instruments like x-ray techniques, imaging techniques, spectroscopic techniques and thermal techniques. It is targeted towards educated youth seeking career in industrial sector.

  • Tailor made Program: Depending on the type of industry a combination of analytical techniques will be covered for solving specific problems of analysis faced by industries.

Contact Persons:

Dr. S. Radhakrishnan
Chief Scientist
Central Instrumentation Facility
Phone: 04565 241533/ 241466
email: sradhakrishnan[at]cecri.res.in